Supports quick switching between instruments with the same functionality

  Add sensors to monitor the wafer adsorption status (compatible with 2 to 12 inches)

  Upgrade to achieve higher positioning accuracy and repeat positioning accuracy throughout the entire stroke

  Configure temperature sensors to continuously monitor the temperature changes of the Stage

  Upgrade the magnification and resolution of the top vision, and support one-click magnification switching

  Upgrade the auxiliary vision to clearly observe the relative height between the optical fiber/probe and the wafer

  Supports custom height sampling points, with full-wafer height scanning completed in under 5 minutes

  Features a new architecture software with separated Prober and Tester; Tester supports asynchronous data processing for faster testing

  Data statistics and analysis

  WLR and other R & D verification

  Temperature range: -40°C to 125°C, customizable

  Comprehensive testing of all relevant metrics for OO/OE/EE (IL/PDL/WDL/R/Split Ratio/Xtalk, etc.)

  Supports both grating and end-face coupling methods

 Compatible with single - mode fiber, lensed fiber, multi - channel FAU, multi - channel optical probes, etc.

  Supports wafer sizes up to 12 inches, with backward compatibility down to 2 inches. 

  Supports four-quadrant working mode

  Can perform fast IV characteristic analysis

  Low cost, high precision, high speed

  Polarization-maintaining fiber output

  Benchtop package