Supports single - chip - level testing
Ink marking for defective chips
DC testing, RF testing
Data statistics and analysis
WLR and other R & D verification
Temperature range: -40°C to 125°C, customizable
Comprehensive testing of all relevant metrics for OO/OE/EE (IL/PDL/WDL/R/Split Ratio/Xtalk, etc.)
Supports both grating and end-face coupling methods
Compatible with single - mode fiber, lensed fiber, multi - channel FAU, multi - channel optical probes, etc.
Supports wafer sizes up to 12 inches, with backward compatibility down to 2 inches.