Inline Wafer Test Solution

Eternal Wafer Test System provides an ultra-wide temperature range and high-precision automated testing capabilities. It currently supports wafer-level edge coupling, RF testing, and single-die debugging and testing, covering test scopes such as OO, OE, and EE. The system is also compatible with overhead hoist transport (OHT) systems or automated guided vehicle (AGV) integration.

硅光测试高精度电源模块解决方案  The real-time height probing function is optional

硅光测试高精度电源模块解决方案  Significantly improves coupling speed

硅光测试高精度电源模块解决方案  Adds automatic FA angle adjustment to enhance FA calibration efficiency

硅光测试高精度电源模块解决方案  Supports quick switching between instruments with the same functionality

硅光测试高精度电源模块解决方案  Add sensors to monitor the wafer adsorption status (compatible with 2 to 12 inches)

硅光测试高精度电源模块解决方案  Upgrade to achieve higher positioning accuracy and repeat positioning accuracy throughout the entire stroke

硅光测试高精度电源模块解决方案  Configure temperature sensors to continuously monitor the temperature changes of the Stage

硅光测试高精度电源模块解决方案  Upgrade the magnification and resolution of the top vision, and support one-click magnification switching

硅光测试高精度电源模块解决方案  Upgrade the auxiliary vision to clearly observe the relative height between the optical fiber/probe and the wafer

硅光测试高精度电源模块解决方案  Supports custom height sampling points, with full-wafer height scanning completed in under 5 minutes

硅光测试高精度电源模块解决方案  Features a new architecture software with separated Prober and Tester; Tester supports asynchronous data processing for faster testing

Detailed Introduction

The design of the Inline wafer stage needs to comprehensively consider many aspects such as flatness, stability, material selection, thermal management, electromagnetic compatibility, vacuum compatibility, transmission mechanism, cleaning and maintenance, sensor integration, automation and integration, as well as safety and reliability, so as to ensure its efficient and stable operation and meet the requirements of semiconductor manufacturing.


〇    Utilizing robotic arms for wafer transfer to minimize manual operational errors and contamination from rubber gloves on the wafers

〇    Employing ceramic trays to ensure thermal stability and physical inertness of the materials

〇    Equipped with testing capabilities such as OO/OE/EE/RF

〇    Flexible configuration of test items and ranges, with mature testing solutions available for one-click import

〇    Customizable product database with automatic report generation

〇    Capable of integrating with MES systems

〇    Unmanned operation with remote controllability

〇    Interface with Crane Tracks and Protocols

Inline Wafer Test Solution

Architectural Diagram of the Overhead Hoist Transport (OHT) and Inspection Equipment Interface System


〇    High-Precision Hardware Docking: Via automatic positioning mechanisms and customized pick-and-place interfaces

〇    Intelligent Software Collaboration: Integrates MCS system with real-time monitoring platform

〇   Triple Safety Protection: Combines anti-collision warning, overtime protection, and emergency power supply mechanisms to ensure stable system operation and rapid fault recovery

Features

Detailed Introduction

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Questions?

Eternal team is at your service!

Tel: (+86) 027-87001679

Email: sales@eternal-technologies.com