ETERNAL-Laser Chip Test System (20-95°C) 

With the rapid development of the optical communication and lidar industries, the performance verification and mass production screening of laser chips such as DFB/EML have raised higher demands on testing equipment. Wuhan Yitiannuo Technology Co., Ltd.'s high-temperature laser chip test bench provides a high-precision, high-throughput, and fully automated testing solution for laser chips throughout the entire process.

The high-temperature laser chip test bench is a high-precision automated testing system specifically designed for the performance verification and batch screening of laser chips. This system integrates functional modules such as blue film ID recognition, blue film ring material retrieval, chip handling, high-temperature testing, and automatic sorting and feeding. It utilizes dual-actuator linear motors, high-precision electric sliding tables, and marble platforms to ensure long-term operational stability and repeatability, comprehensively covering both research and development verification and batch screening scenarios.

Applicable test items

• Spectral analysis test: Measure wavelength, bandwidth, power, and SMSR, and assess the stability of the light source and the purity of the spectrum;

• LIV test: Obtain the optical power-current-voltage characteristic curve, and extract the threshold current and slope efficiency;

• High-temperature reliability testing: verifying the performance changes of chips in different temperature zones within the range of 20~95℃.

It is suitable for batch screening, yield monitoring during the mass production stage, as well as performance characterization and benchmarking analysis in the device research and development process.

Nine core characteristics define efficient testing

• Dual-temperature parallel testing: With independent parallel temperature control for dual stages, achieving a stability of ±0.2℃. Simultaneously testing two chips doubles the efficiency;

• High-precision photoelectric light receiving: LIV employs a φ10 large photosensitive surface detector, and the spectrum utilizes a collimating lens, equipped with an automatic calibration function to ensure accurate power and wavelength data;

• Fully automated loading, unloading, and sorting: A thimble and dual linear motors automatically strip bare dies, supporting the automatic sorting of multiple blue films according to rules;

• Visual positioning and automatic acupuncture: A novel intelligent multi-angle recognition system, coupled with a high-precision electric shaft, facilitates rapid position correction and automatic acupuncture;

• High-precision and wide-range electrical measurement: LD current 0~1000mA (pulse: 3000mA), voltage 0~15V (accuracy 0.3%), expandable with external source meter;

• Real-time display: The host computer presents the LIV curve and spectrogram in real-time;

• Automatic adjustment: The probe pressure and suction nozzle suction pressure are adjustable;

• Comprehensive equipment protection mechanism: Each power supply channel is equipped with independent circuit breaker protection, with the option of UPS, and is equipped with safety interlock and EMO emergency stop;

• Flexibility, Compatibility, and Scalability: Compatible with DC probe cards, automatically reads chip SNs, provides secondary development interfaces, facilitating integration into production lines or customization of processes.

ETERNAL welcomes inquiries about cooperation

Laser Chip Test System (20-95°C)  are available for consultation and customization

Contact us for detailed technical specifications or to arrange a product demonstration