ETERNAL-COC Burn-in Test System

With the structural industrial explosion driven by AI computing power, the demand for optical chips has surged, and chip-level high-throughput reliability screening has become an essential requirement in the industry. The Yitiannuo LHX-306-COC aging test machine is a fully automated, integrated, and efficient production line equipment designed for the large-scale production of laser chips, specifically tailored for chip aging screening and performance testing processes. This system integrates high-density multi-channel driving, independent precise temperature control, online power monitoring, and intelligent data analysis, covering various laser batch aging test requirements.

Mainframe rack configuration

Utilizing a main frame and large single-layer structure design, it integrates multi-channel drive power supplies, temperature controllers, and real-time data acquisition functions. Standardized drawers and customized aging fixtures are suitable for COCs of different sizes.

Single-layer configuration

The single-layer structure adopts a modular design, integrating a drive power board, standardized drawers, a temperature control system, and a DC power supply.

Six major advantages, establishing it as the preferred choice for performance

• Ultra-high-density channel: The single system supports simultaneous aging of up to thousands of source measurement units. The entire machine integrates multiple layers of aging units, with multiple independent drawers on each layer, providing high-density parallel aging capabilities to meet the needs of large-scale simultaneous testing;

• Independent and precise temperature control: Each fixture is equipped with independent heating, temperature control, monitoring, overtemperature protection, and cooling units, achieving energy-saving temperature control in different zones and avoiding energy waste and temperature unevenness in overall temperature control;

• High-precision drive power supply: Equipped with ACC automatic current control mode, it maintains a constant aging current during fluctuations in contact resistance, ensuring accurate and reliable testing;

• Dual safety protection: The drive board adopts a collaborative mechanism of hardware protection and software control to eliminate risks such as EOS, overcurrent, and overvoltage from the source. Communication disconnection will automatically stop aging within a certain period of time, and after an abnormal stop, it supports continuous aging, adapting to all-weather continuous operation;

• Online monitoring and intelligent analysis: Supports external PD current acquisition, possesses Ith threshold analysis capability, and achieves test repeatability better than ±1%. All data are automatically saved to a database, supporting historical traceability, quick query, and integration with MES systems;

• After aging is completed, the drawer can be directly placed on the test bench station for further testing and analysis of threshold current, spectrum, etc.

Multi-scenario application

Optical communication chip mass production aging line

Lidar and Automotive Optoelectronics

Data center and 5G infrastructure

Research and Development and Pilot Testing

The drive current can be customized for output, and flexible software configuration allows for compatibility with diverse aging schemes during the introduction phase of new products.

ETERNAL welcomes inquiries about cooperation

Laser Chip Test System (20-95°C)  are available for consultation and customization

Contact us for detailed technical specifications or to arrange a product demonstration