The Laser Bar Chip Test System is a fully automated testing system dedicated to evaluating the optoelectronic performance of BAR-type laser chips. The equipment integrates high-precision visual positioning, multi-axis motion platform, temperature-controlled stage, and integrating sphere/collimating lens light-receiving module, suitable for LIV comprehensive testing and spectral analysis testing under both room temperature and high temperature (adjustable from 25 to 85°C) environments. It can comprehensively quantify key parameters of the chip such as threshold current, slope efficiency, optical output power, peak power, forward voltage, and wavelength. The system adopts a modular design, including top-view, bottom, and auxiliary visual components, as well as multiple sets of precision motion axes such as material loading and handling, stage movement, probe card handling, and integrating sphere handling. Coupled with an air-bearing optical platform and TEC temperature control fixtures, it ensures test repeatability and stability.