Dual-temperature parallel testing: Independent parallel temperature control of dual stages, with stability of +0.2°C. Simultaneous testing of two chips effectively enhances efficiency；

High-predsion photoelectric light receiving: Supports front and back optical testing. LIV uses a 10mm*10mm photosensitive surface detector, and spectroscopy uses a collimating lens. It features an automatic calibration function to ensure accurate power and wavelength data；

Fully automatic loading, unloading and sorting system: Bare dies are automatically stripped by ejector pins paired with dual linear motors, and the equipment supports rule-based automatic sorting of multiple blue tapes；

Visual positioning and automatic pin insertion: A novel intelligent multi-angle recognition system, coupled with a high-precision electric motorized axis, facilitates rapid position correction and automatic pin insertion；

High-predision wide-range output: LD current ranging from 0-1000mA (pulse: 3000mA), voltage from 0-15V (accuracy 0.3%), with the option to connect an external source meter for expansion；

Real-time display: The host computer presents the LIV curve and spectral diagram in real-time；

Automatic adjustment: The probe pressure and suction nozzle suction pressure are adjustable；

Comprehensive safety protection mechanism: Each power supply is independently protected by a circuit breaker, with the option to select a UPS, equipped with safety interlocks and EMO emergency stop；

Flexible compatibility and expansion: Compatible with DC probe cards, automatically reads chip SNs, provides secondary development interfaces, facilitating integration into production lines or customization of processes.